JOPSS - Search Results

Journal Articles

Ultrasoft-X-ray emission spectroscopy using a newly designed wevelength-dispersiv spectrometer attached to a transmission electron microscope

Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; et al.

Journal of Electron Microscopy, 61(1), p.1 - 8, 2012/02

https://doi.org/10.1093/jmicro/dfr076

Times Cited Count：33 Percentile：86.45(Microscopy)

A new grating (JS50XL) for spectroscopy of ultrasoft-X-ray in an energy range of 50-200 eV was designed, manufactured and tested. A spectrometer composed of the grating and a multi-channel plate (MCP) detector was constructed. At the low energy end of this spectrometer, a sharp Fermi-edge of Mg-L emission was observed at 49.5 eV with an energy resolution of 0.15 eV. Li-K emission spectra were obtained from metal-Li, surface-oxidized metal-Li and 5%Li-Al. Relative energy shifts observed in Al-L emission spectra of Al, AlN and MgAl $_{2}$ O $_{4}$ were explained by shifts of core binding energies (chemical shift) and band gap energies of those materials. Si-L emissions from Si, SiC and SiO $_{2}$ (quartz), and P-L emissions from GaP and InP were presented. These ultrasoft-X-ray emission spectra show a successful extension to lower energy range by using the new soft-X-ray emission spectroscopy (SXES) instrument in electron microscopy.

Journal Articles

Heavy ion irradiation induces autophagy in irradiated C2C12 myoblasts and their bystander cells

Hino, Mizuki*; Hamada, Nobuyuki*; Tajika, Yuki*; Funayama, Tomoo; Morimura, Yoshihiro*; Sakashita, Tetsuya; Yokota, Yuichiro; Fukamoto, Kana*; Muto, Yasuko; Kobayashi, Yasuhiko; et al.

Journal of Electron Microscopy, 59(6), p.495 - 501, 2010/12

https://doi.org/10.1093/jmicro/dfq059

Times Cited Count：16 Percentile：64.71(Microscopy)

Journal Articles

Developments of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes; An Introduction of valence electron spectroscopy for transmission electron microscopy

Terauchi, Masami*; Koike, Masato; Fukushima, Kurio*; Kimura, Atsushi*

Journal of Electron Microscopy, 59(4), p.251 - 261, 2010/08

https://doi.org/10.1093/jmicro/dfq010

Times Cited Count：36 Percentile：87.32(Microscopy)

Two types of wavelength-dispersive soft-X-ray spectrometers, a high-dispersion type and a conventional one, for transmission electron microscopes were constructed. Both spectrometers were extended energy regions 2000 eV. The best energy resolution of 0.08 eV was obtained for an Al L-emission by using the high-dispersion type. W-M and Si-K emissions were clearly resolved by using the conventional type. Soft-X-ray emission spectroscopy based on transmission electron microscopy has an advantage for obtaining spectra from a single crystalline specimen with a defined crystal setting. From C K-emission spectra of single crystalline graphite with different crystal settings, density of states of - and -bondings were separately derived. Those results demonstrated a method to analyze the electronic states of valence electrons of materials in the nanometer scale based of transmission electron microscopy.